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AGI Analytical Capabilities
Our facilities offer a comprehensive line up of
analytical services to cover your needs



Equipment THE PHILIPS XL-30 ESEM
The Philips XL-30 ESEM
Environmental Scanning Electron Microscope

This allows us to perform a large variety of experiments that were not possible with a conventional SEM. This particular Environmental Scanning Electron Microscope utilizes Energy Dispersive X-ray spectroscopy for microstructural and chemical analysis. Running the ESEM in a “high-pressure” environmental mode allows for the examination of hydrated or insulating samples, unlike other SEMs which require the specimen chamber to have a high vacuum. This machine has the capability to imaging virtually any sample, the only exceptions being volatile liquids and gases. Non-volatile liquids are scannable by cooling them to a temperature so that their vapor pressure drops enough to prevent unwanted evaporation. Because the water vapor acts to neutralize any charge buildup on the surface of the sample, almost no preparation is required. It is possible to obtain images of materials with low electrical conductivity without having to add a conductive layer to it. The benefit of this is that now every sample is seen naturally. It is able to perform elemental mapping over lines or area scans along with the other innovations provided, it is also possible to heat samples as high as 1500° C. The XL30 provides element identification of carbon and higher atomic numbers. It is good for identifying what elements are present and their relative proportions.

SIEMENS D5000 X-RAY DIFFRACTOMETER 
Placeholder PictureSiemens D5000 X-ray Diffractometer
Analyzes the structure of a material from the scattering pattern produced when a beam of radiation or particles interacts with it

Because of the 40 position automatic sample changer and a cobalt X-ray tube we are able to characterize the properties of various materials on an atomic scale. This device with take measurements and use them to gain information about crystal structure, lattice strain, state of ordering, and chemical composition. The D5000 can also analyze monolithic or powder samples to determine whether they are crystalline or amorphous. If the sample is crystalline then it will determine what crystalline phase or structure the sample happens to be. One of the benefits of the D5000 is that it is a theta/theta powder diffractometer. This means that the both the X-ray source and the X-ray detector are capable of movement.

MICROMERITICS TRISTAR II BET ANALYZER
Placeholder PictureSiemens D5000 X-ray Diffractometer
Surface Area and Porosity Analyzer

This is a fully automated, three-station, surface area and porosity analyzer that delivers high-quality data. It is capable of increasing the speed and efficiency of routine quality control analyses, yet has the accuracy, resolution, and data reduction capability to meet most research requirements. The TriStar II also features a Krypton Option, allowing measurements in a very low surface area range. The instrument combines versatility in analysis methods and data reduction to allow the user to optimize analyses to specific applications.Surface area and porosity are important physical properties that influence the quality and utility of many materials and products. Therefore it is critically important that these characteristics be accurately determined and controlled. Likewise, knowledge of surface area and especially porosity often is an important key to understanding the formation, structure, and potential application of many natural materials.

(Quoted from Micrometrics website)

RENISHAW INVIA RAMAN MICROSCOPE
Placeholder PictureSiemens D5000 X-ray Diffractometer
Research-grade Confocal Raman Microscope

With both 633 nm and 532 nm wavelength lasers available, the highly efficient optical design gives us the ability to identify certain organic and inorganic materials, even from minute traces of material. We have the capability to identify and characterize the quality of graphene, carbon nanotubes, carbon nanofibers, graphite, and much more.

BRUKER NANO NPF FLEX
Placeholder PictureSiemens D5000 X-ray Diffractometer
Large-Sample, Non-Contact Surface Analyzer

The NPFLEX™ provides the most flexible, non-contact, 3D areal surface characterization for such large samples as orthopedic medical implants and the larger parts in aerospace, automotive and precision machining industries. The NPFLEX also provides data density, resolution, and repeatability beyond what is possible with contact instrumentation, making it ideal as both a complementary technology or as a stand-alone metrology solution. The NPFLEX enables superior flexibility, accuracy, and throughput for precision manufacturing, providing an easy path to tighter tolerances, more efficient processes, and better end products.

(Quoted from Bruker website)

MICRO_VU VERTEX 251
Placeholder PictureSiemens D5000 X-ray Diffractometer
Coordinate Measuring Machine

The Vertex Measuring Center is our solution for smaller parts. It is a high precision and Powerful Machine Vision System. The Vertex has a compact design, machine-side electronics, and an external computer. New systems are both Probe and Rotary Ready. Along with a 42 channel lighting system it has a programmable 6:1 or 12:1 zoom lens. The “mono-rail” bearing design and fast servo motor control provide for high reliability. With this device we are able to get fast, accurate Z measurements.

ADDITIONAL EQUIPMENT INCLUDES:
  • iCAP Q + Cetac LSX-213 Laser Ablation System
  • Rockwell B/Rockwell C hardness tester – HR-15A
  • Instron 4201 Tensile Tester
  • TA Instruments SDT-Q600
  • Across International Particle Size Analyzer LPA-9ST
  • Nikon 100-1000X Confocal microscope with digital camera
  • Nikon 10-40X Stereo Microscope with digital camera
  • Leica Z16 5-92X Macroscope with digital camera and calibrated measurement capabilities
  • SRI 8610C Gas Chromatograph
  • SRI 8610C Gas Chromatograph (10x Sensitivity)
  • HP 4339A + Agilent 16008B Resistivity Cell
  • Hiden HPR20 Mass Spectrometer
  • Brookfield DVII Viscometer
  • Orton RSV-1600 Viscometer
  • Agilent 4263B LCR Meter
  • HP 4194A Impedance Analyzer
  • Thermotron Thermal Cycling
  • Zeiss Surfcom 1500SD, contact profilometer
  • Olympus 38DL Ultrasonic Thickness Gauge and Modulus Measurement
  • Agilent VSBR15 He Mass Spec Leak Detector
  • Archimedes’ method density measurement
  • Chatillon TCD 200 Tensile Tester
  • AND BM-20 Digital Scale
  • Buehler Isomet 4000 Precision Saw

“You get paid a lot more when you offer a transformation than you do a transaction.” – Dan Sullivan