This allows us to perform a large variety of experiments that were not possible with a conventional SEM. This particular Environmental Scanning Electron Microscope utilizes Energy Dispersive X-ray spectroscopy for microstructural and chemical analysis. Running the ESEM in a “high-pressure” environmental mode allows for the examination of hydrated or insulating samples, unlike other SEMs which require the specimen chamber to have a high vacuum. This machine has the capability to imaging virtually any sample, the only exceptions being volatile liquids and gases. Non-volatile liquids are scannable by cooling them to a temperature so that their vapor pressure drops enough to prevent unwanted evaporation. Because the water vapor acts to neutralize any charge buildup on the surface of the sample, almost no preparation is required. It is possible to obtain images of materials with low electrical conductivity without having to add a conductive layer to it. The benefit of this is that now every sample is seen naturally. It is able to perform elemental mapping over lines or area scans along with the other innovations provided, it is also possible to heat samples as high as 1500° C. The XL30 provides element identification of carbon and higher atomic numbers. It is good for identifying what elements are present and their relative proportions.
Because of the 40 position automatic sample changer and a cobalt X-ray tube we are able to characterize the properties of various materials on an atomic scale. This device with take measurements and use them to gain information about crystal structure, lattice strain, state of ordering, and chemical composition. The D5000 can also analyze monolithic or powder samples to determine whether they are crystalline or amorphous. If the sample is crystalline then it will determine what crystalline phase or structure the sample happens to be. One of the benefits of the D5000 is that it is a theta/theta powder diffractometer. This means that the both the X-ray source and the X-ray detector are capable of movement.
This is a fully automated, three-station, surface area and porosity analyzer that delivers high-quality data. It is capable of increasing the speed and efficiency of routine quality control analyses, yet has the accuracy, resolution, and data reduction capability to meet most research requirements. The TriStar II also features a Krypton Option, allowing measurements in a very low surface area range. The instrument combines versatility in analysis methods and data reduction to allow the user to optimize analyses to specific applications.Surface area and porosity are important physical properties that influence the quality and utility of many materials and products. Therefore it is critically important that these characteristics be accurately determined and controlled. Likewise, knowledge of surface area and especially porosity often is an important key to understanding the formation, structure, and potential application of many natural materials.
(Quoted from Micrometrics website)
With both 633 nm and 532 nm wavelength lasers available, the highly efficient optical design gives us the ability to identify certain organic and inorganic materials, even from minute traces of material. We have the capability to identify and characterize the quality of graphene, carbon nanotubes, carbon nanofibers, graphite, and much more.
The NPFLEX™ provides the most flexible, non-contact, 3D areal surface characterization for such large samples as orthopedic medical implants and the larger parts in aerospace, automotive and precision machining industries. The NPFLEX also provides data density, resolution, and repeatability beyond what is possible with contact instrumentation, making it ideal as both a complementary technology or as a stand-alone metrology solution. The NPFLEX enables superior flexibility, accuracy, and throughput for precision manufacturing, providing an easy path to tighter tolerances, more efficient processes, and better end products.
(Quoted from Bruker website)
The Vertex Measuring Center is our solution for smaller parts. It is a high precision and Powerful Machine Vision System. The Vertex has a compact design, machine-side electronics, and an external computer. New systems are both Probe and Rotary Ready. Along with a 42 channel lighting system it has a programmable 6:1 or 12:1 zoom lens. The “mono-rail” bearing design and fast servo motor control provide for high reliability. With this device we are able to get fast, accurate Z measurements.
“You get paid a lot more when you offer a transformation than you do a transaction.” – Dan Sullivan